Falanqaynta Fashilka MOSFET: Fahamka, Ka Hortagga, iyo Xalka

Falanqaynta Fashilka MOSFET: Fahamka, Ka Hortagga, iyo Xalka

Waqtiga Dambe: Dec-13-2024

Dulmar degdeg ah:MOSFET-yadu way ku fashilmi karaan sababo koronto, kulayl iyo culaysyo farsamo oo kala duwan awgeed. Fahamka hababkan guuldarrooyinka ayaa muhiim u ah naqshadaynta nidaamyada korantada ee la isku halayn karo. Hagahan dhamaystiran waxa uu sahmiyaa hababka guul darada ee caadiga ah iyo xeeladaha ka hortagga.

Celceliska-ppm-loo-la duwan-MOSFET-Failure-HababHababka Fashilka MOSFET ee Caadiga ah iyo Sababahooda xididka ah

1. Guuldarrooyinka Voltage-La xidhiidha

  • Burburka Albaabka oksaydhka
  • Burburka barafku
  • Feer-ku-dhac
  • Burburka dheecaanka taagan

2. Guuldarrooyinka kulaylka la xidhiidha

  • Burburka labaad
  • Kulaylka cararka
  • Kala saarista xirmada
  • Kor u qaadida xadhigga dammaanadda
Habka Fashilka Sababaha Aasaasiga ah Calaamadaha digniinta Hababka Ka Hortagga
Burburka Gate Oxide VGS xad dhaaf ah, dhacdooyinka ESD Korodhka ka daadashada albaabka Ilaalinta danabka albaabka, cabbirada ESD
Heerkulka Runnaway Koronto xad dhaaf ah Heerkulka sare u kaca, xawaaraha beddelka oo yaraada Naqshad kuleyl ah oo habboon, derating
Burburka Burburka Kor-u-qaadka korantada, beddelka kicinta ee aan xidhnayn Wareegga gaaban ee il-biyoodka Wareegyada snubber, xirmooyinka danabka

Xalka MOSFET adag ee Winsok

Jiilkeenii ugu dambeeyay ee MOSFETs ayaa leh habab ilaalineed oo horumarsan:

  • SOA-da la xoojiyey (Aagga ka shaqaynta badbaadada leh)
  • Waxqabadka kulaylka oo la hagaajiyay
  • Ilaalinta ESD-ku-dhisan
  • Naqshado lagu qiimeeyay baraf-beelka

Falanqaynta Faahfaahsan ee Hababka Fashilmay

Burburka Gate Oxide

Halbeegyada Muhiimka ah:

  • Korontada Albaabka-Isha ugu badan: ± 20V caadiga ah
  • Dhumucda Albaabka Oxide: 50-100nm
  • Xoogga Goobta Burburinta: ~ 10 MV/cm

Tallaabooyinka Ka Hortagga:

  1. Hirgeli xirista danabka albaabka
  2. Isticmaal iska caabiyeyaasha albaabka taxanaha ah
  3. Ku rakib TVS-daoods
  4. Hababka qaabaynta PCB ee habboon

Maareynta kulaylka iyo Kahortagga Fashilka

Nooca Xidhmada Heerkulka ugu sarreeya Derating lagu taliyay Xalka qaboojinta
TO-220 175°C 25% Heatsink + taageere
D2PAK 175°C 30% Aagga Naxaasta Weyn + Kuleyliyaha Ikhtiyaarka ah
SOT-23 150°C 40% PCB Copper shub

Talooyinka Naqshadeynta Aasaasiga u ah Isku hallaynta MOSFET

Qaabka PCB

  • Yaree aagga wareegga albaabka
  • Awood gooni ah iyo saldhigyada calaamadaha
  • Isticmaal isku xirka isha Kelvin
  • Wanaaji meelaynta kulaylka

Ilaalinta Wareegga

  • Hirgeli wareegyada bilawga jilicsan
  • Isticmaal shumacyo ku habboon
  • Ku dar ilaalinta korantada gadaasha
  • La soco heerkulka qalabka

Habka baaritaanka iyo baaritaanka

Nidaamka Imtixaanka MOSFET ee aasaasiga ah

  1. Tijaabada Halbeegyada Joogtada ah
    • Korontada heerka albaabka (VGS(th))
    • Isha biya-baxa iska caabbinta (RDS(daar))
    • Albaabka daadinta hadda (IGSS)
  2. Tijaabada firfircoon
    • Waqtiyada beddelka (ton, toff)
    • Tilmaamaha kharashka albaabka
    • awoodda wax soo saarka

Adeegyada Kobcinta Kalsoonida ee Winsok

  • Dib u eegis codsi oo dhamaystiran
  • Falanqaynta kulaylka iyo hagaajinta
  • Tijaabada lagu kalsoonaan karo iyo xaqiijinta
  • Taageerada shaybaadhka falanqaynta fashilantay

Tirakoobka Isku-kalsoonaanta iyo Falanqaynta Nolosha

Halbeegyada Kalsoonida Muhiimka ah

Heerka FIT (Guuldarada wakhtiga)

Tirada guuldarrooyinka bilyankii qalab-saacadood

0.1 - 10 FIT

Iyadoo lagu salaynayo taxanihii MOSFET ee u dambeeyay ee Winsok

MTTF (Waqtiga Ku-meel-gaadhka ah ee Guul-darrada)

Nolosha la filayo iyadoo lagu jiro xaalado cayiman

>10^6 saacadood

At TJ = 125 ° C, danab magac leh

Heerka badbaadada

Boqolkiiba aaladaha ka badbaaday muddada dammaanadda

99.9%

5 sano oo shaqo joogto ah

Qodobbada Waxyeelaynta Nolosha

Xaalada Shaqada Qodobka Derating Saamaynta Nolosha
Heerkulka (10°C kasta oo ka sarreeya 25°C) 0.5x 50% hoos u dhac
Cadaadiska Voltage (95% ee qiimeynta ugu badan) 0.7x 30% hoos u dhac
Inta jeer ee beddelka (2x magac ahaan) 0.8x 20% hoos u dhac
Qoyaanka (85% RH) 0.9x 10% dhimis

Qaybinta itimaalka cimriga

sawirka (1)

Qaybinta Weibull ee MOSFET nolosheeda oo muujinaysa guuldarrooyin hore, guuldarrooyin random-ka ah, iyo muddada daalnimada

Arrimaha Cadaadiska Deegaanka

Baaskiilka heerkulka

85%

Saamaynta dhimista nolosha

Baaskiil koronto

70%

Saamaynta dhimista nolosha

Cadaadiska Makaanikada

45%

Saamaynta dhimista nolosha

Natiijooyinka Imtixaanka Nolosha ee La Dardargeliyay

Nooca Imtixaanka Shuruudaha Muddada Heerka Fashilka
HTOL 150°C, ugu badnaan VDS 1000 saacadood <0.1%
THB ( eexda qoyaanka heerkulka) 85°C/85% RH 1000 saacadood <0.2%
TC (Baaskiilada heerkulka) -55°C ilaa +150°C 1000 wareeg <0.3%

Barnaamijka Hubinta Tayada ee Winsok

2

Tijaabada Baaritaanka

  • 100% tijaabinta wax soo saarka
  • Xaqiijinta cabbirka
  • Sifooyin firfircoon
  • Kormeer muuqaal ah

Imtixaanada U qalmida

  • Baadhitaanka walaaca deegaanka
  • Xaqiijinta kalsoonida
  • Baaritaanka daacadnimada xirmada
  • La socodka kalsoonida muddada-dheer